BIST-Based Diagnostics of FPGA Logic Blocks
نویسندگان
چکیده
منابع مشابه
Power-on Built-in Self-Test for FPGA
-Built-in self-test (BIST) is a design technique that allows a circuit to test itself. It is a set of structured-test techniques for combinational and sequential logic, memories, multipliers and other embedded logic blocks. BIST consists of a controller, and circuits for input excitation and output validation. A BIST circuit comprises a scan monitor with hold logic and a signature generation el...
متن کاملOn-Chip BIST-Based Diagnosis of Embedded Programmable Logic Cores in System-on-Chip Devices
On-chip Built-In Self-Test (BIST) based diagnosis of the embedded Field Programmable Gate Array (FPGA) core in a generic System-on-Chip (SoC) is presented. In this approach, the embedded processor core in the SoC is used for reconfiguration of the FPGA core for BIST, initiating the BIST sequence, retrieving the BIST results, and for performing diagnosis of faulty programmable logic blocks, memo...
متن کاملBIST for Logic and Memory Resources in Virtex-4 FPGAs
We present a Built-In Self-Test (BIST) approach for testing and diagnosing the programmable logic and memory resources in Xilinx Virtex-4 series Field Programmable Gate Arrays (FPGAs). The resources under test include the programmable logic blocks (PLBs) and block random access memories (RAMs) in all of their modes of operation. The BIST architecture and configurations needed to completely test...
متن کاملBIST-based test and diagnosis of FPGA logic blocks
We present a built-in self-test (BIST) approach able to detect and accurately diagnose all single and practically all multiple faulty programmable logic blocks (PLBs) in field programmable gate arrays (FPGAs) with maximum diagnostic resolution. Unlike conventional BIST, FPGA BIST does not involve any area overhead or performance degradation. We also identify and solve the problem of testing con...
متن کاملImplementation of Restartable BIST Controller for Fault Detection in CLB of FPGA
Today Field Programmable Gate Arrays (FPGAs) are widely used in many applications. Complicated integrated circuit chips like FPGAs are prone to different types of Faults due to environmental conditions or aging of the device. The rate of occurrence of permanent faults increases with emerging technologies because of increased density and reduced feature size, and hence there is a need for period...
متن کامل